Operator Manual

1. Power and connect

• Turn off the power supply before connecting any cables.
• Connect the GND (negative) cable from the PSU to the hashboard.
• Connect the positive cable from the PSU to the hashboard.
• Finally, connect the tester's signal connector to the hashboard.
• Turn on the hashboard's power supply.
• Turn on the tester (ESP32 USB).

2. Web Interface

On first use (without configured network), the tester creates its own Wi-Fi network:

Connect your phone or PC to this network and open the address in your browser. If already connected to your local network, use the IP displayed on the OLED screen.

3. Model selection

Upon connecting the hashboard, the tester reads the EEPROM and selects the model automatically in ~2.6 seconds. If not recognized, select it manually in the dropdown.

🔌 Legacy EEPROM

NBS1902, NBP1901 and NBS2003 use Bitmain's Legacy format. The NBS1902 is detected automatically. If it appears as LEGACY011, select manually.

4. Signal Flow Panel

Left side panel with visual indicators of physical signals during testing. All signals use a 1.2V LDO.

Click any signal to see a wave flowing through the chips on the grid. Use the Signals button on the topbar to show/hide the panel.

5. Chip map

• OK — passed
• Fail — did not respond
• Unstable — intermittent
• Waiting
• Boost — step-up circuit

Hover over a chip to see: number, domain, nonces/ACKs, and failures. The map updates automatically after each test without reloading the page.

6. Recommended test flow

Each subsequent test assumes the previous one passed. Use LiveScan only for quick visual diagnostics before starting formal tests.

7. LiveScan

Continuous reading of the chain in near real-time. Does not execute load patterns — only light read-id/ping. Sensors are read at start and updated periodically.

When to use

• Diagnosing bad contacts, missing chips, or unstable chains
• Checking how many chips respond on a board with known defects
• First contact with an unknown hashboard

LiveScan does not replace formal tests for board approval.

8. Basic Pattern (Scan)

Chain test: turns on PIC, resets hashboard, reads EEPROM, detects chips, prepares chain, and executes basic verification. Does not send hashing jobs — only detects chips.

Chips that failed appear in red on the map.

9. Pattern+ Test

Executes extensive patterns per chip using vectors from the SD card when available. Detects chips that pass Basic Pattern but fail under different work patterns.

📄 SD Card

If no vector files are available on the SD, the test uses a reduced internal coverage. The log warns when this happens.

10. Pattern 2 Test

Alternative cycle requiring real SHA256 nonce. A board that passes Basic Pattern but fails here has marginal chips — they work in basic patterns but are unstable under real load.

11. Mining

Full load with real SHA256 jobs (full-header). Approves only chips that return a valid SHA256 nonce (type4). Each cycle runs until 99.5% of chips deliver at least 3 nonces.

Progress Modal

💡 Tip: Closing the modal does not stop the test. To reopen, click the Mining button again in the topbar while the test is running.

Frequency by model

* S19/T19 76C limited to 650 MHz even if EEPROM reports a higher value.

Approval Criteria

Expected Nonce Distribution

A variation of 5 to 28 nonces among chips in the same cycle is normal — SHA256 has a random component by design.

12. Temperature

Normal ranges: intake 30–50°C, exhaust 60–85°C. -- = sensor did not respond.

13. Stop a test

Click Stop on the topbar at any time. The state of the chips up to that point is preserved on the map.

14. EEPROM Editor

Click the EEPROM button on the topbar to access the editor.

15. Config (gear icon)

Wi-Fi Tab

• Click Scan networks
• Select the SSID and enter the password
• Click Connect

SD Tab

Shows if the SD is mounted and which vector files are available. OK = external file present. internal fallback = SD mounted but without external file; firmware uses built-in vector.

Test Tab

Defines the number of Basic Pattern cycles (3, 5, 10, or 20).

Visual Tab

Interface color palette selection (Current / Modern / Industrial). Saved in browser, does not alter firmware.

Firmware Tab (OTA)

• Click Choose file
• Select a .bin file: update_vX_Y.bin (full bundle), firmware.bin or spiffs.bin. Type is auto-detected
• Click Send and update
• Wait for the bar to complete — the tester restarts automatically

16. Event Log

17. Troubleshooting

SD Card Errors

Timeout (0x107)

sdmmc_read_sectors_dma: sdmmc_send_cmd returned 0x107

Card poorly inserted, dirty contacts, or defective. Remove, clean, and reinsert.

File not found (errno=22)

Expected folder: /BM1362-pattern/pattern_8midstate.bin or /reference/BM1362-pattern/. BM1362 Mining doesn't depend on SD — uses internal job.

18. Signal Diagnostics (Bitmain)

Troubleshooting sequence (0 chips)

• Power supply voltage (main)
• Domain voltage (~0.32V per chip)
• PIC output (~3.2V on U6 pin 11)
• Boost voltage (20V)
• 1.2V and 0.8V LDO per domain
• CLK/TX/RX/RST signals

💡 Dichotomic Method
Divide the chain in half and measure RO/1.2V at the midpoint to isolate which half has the problem. Repeat until you find the chip.

19. Flow Summary

• 1. Connect: GND → +V → signals → power on tester
• 2. Open http://192.168.4.1 on mobile/PC
• 3. Model auto-detected (~2.6s) or select from dropdown
• 4. LiveScan → optional, quick visual diagnostic
• 5. Basic Pattern → validate chain and basic patterns
• 6. Pattern+ Test → validate extensive per-chip patterns
• 7. Pattern 2 Test → validate with real nonce (marginal chips)
• 8. Mining → validate load with real nonces in cycles
• 9. EEPROM → read, edit, backup, or clone when necessary
• 10. Disconnect: signals → +V → GND

20. Adapter Board Pinout

Pinout validated on workbench for BHB42601/BM1362/126 chips. I2C at 30 kHz.